David and Ellen Lee Postdoctoral Scholar Research Associate in Astronomy
Jean-Baptiste Ruffio
David and Ellen Lee Postdoctoral Scholar Research Associate in Astronomy
Phone:626-395-1591
Mail Code:MC 249-17
The overarching goal of my research has been the development of statistical analysis tools to push instrument’s performance and better understand the population and formation mechanisms of exoplanets. My projects have a strong emphasis on directly imaged planets and high resolution spectroscopy, which are particularly well suited for the study of their atmosphere and composition. The challenge of direct imaging is the intrinsic faintness and proximity of the planets to their parent star. Limiting the starlight contamination at the location of the planet is paramount, which makes it one of the main drivers of my work.
Profile:
My name is Jean-Baptiste Ruffio, I joined Caltech as a David & Ellen Lee Prize Postdoctoral Fellow in 2019 to work on high resolution spectroscopy of exoplanets in Dimitri Mawet's group. Before graduating from Stanford with a Ph.D in Physics, I grew up in Brittany, in the northwestern part of France, and studied aerospace engineering at ISAE-Supaero, Toulouse, France. I am interested in the statistical analysis of astronomical data and the development of new instruments for the study of exoplanets with a special emphasis on directly imaged planets.
